Electronic Test and Instrumentation

Connect any input to any output to simplify wiring in automated test systems.

Integrates non-PXI instruments into your PXI system using the GPIB standard.

Enables Ethernet-based communication between PXI hardware and external instruments and devices and supports GigE Vision cameras without power over Ethernet (PoE).

Performs characterization and production test of semiconductor devices with timing sets and per channel pin parametric measurement unit (PPMU).

Performs voltage, current, resistance, temperature, inductance, capacitance, and frequency/period measurements, as well as diode tests, in PXI systems.

Provides digital input and output capabilities for PXI systems.