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Testforce USAKeithley 4200A-SCS Parameter Analyzer
Accelerate research, reliability and failure analysis studies of semiconductor devices, materials and process development with the 4200A-SCS. The highest performance parameter analyzer, it delivers synchronizing current-voltage (I-V), capacitance-voltage (C-V) and ultra-fast pulsed I-V measurements.
- DC Current-Voltage, (I-V) Range: 10 aA - 1A, 0.2 µV - 210 V
- Capacitance-Voltage, (C-V) Range: 1 kHz - 10 MHz, ± 30V DC bias
- Pulsed I-V Range: ±40 V (80 V p-p), ±800 mA, 200 MSa/sec, 5 ns sampling rate
Parametric insight, fast and clear.
Advancing your bold discoveries has never been easier. The 4200A-SCS Parameter Analyzer reduces the time from setup to running characterization tests by up to 50%, allowing uncompromised measurement and analysis capability. Plus, embedded measurement expertise provides unparalleled test guidance and gives supreme confidence in the resulting measurements.
Highlights
- Advanced measurement hardware for DC I-V, C-V, and pulsed I-V measurement types
- Begin testing immediately with hundreds of user-modifiable application tests included in the Clarius software
- Automated real-time parameter extraction, data graphing, analysis functions
Accurate C-V Characterization
Measure single-digit femtofarads with Keithley's newest capacitance-voltage unit (CVU), the 4215-CVU. By integrating a 1 V AC source into Keithley's industry-leading CVU architecture, the 4215-CVU offers low-noise capacitance measurements at frequencies from 1 kHz to 10 MHz.
Highlights
- First C-V meter in its class capable of driving a 1 V AC source voltage
- 1 kHz frequency resolution from 1 kHz to 10 MHz
- Measure capacitance, conductance, and admittance
- Measure on up to four channels with the 4200A-CVIV Multiswitch
Measure. Switch. Repeat.
The 4200A-CVIV Multi-Switch automatically switches between I-V and C-V measurements without re-cabling or lifting the prober tips. Unlike competing products, the four-channel 4200A-CVIV display provides local visual insight for quick test setup and easy troubleshooting when unexpected results occur.
Highlights
- Move C-V measurement to any device terminal without re-cabling
- User-configurable for low current capability
- Personalize the names of output channels
- View real-time test status
Stable low current measurements for I-V Characterization
With the 4201-SMU and 4211-SMU modules you can achieve stable low current measurements in a high capacitance system. With four models of source measure unit (SMU) to choose from, the 4200A-SCS can be customized to meet all of your I-V measurement needs. By offering field Installable Units and optional preamplifier modules, Keithley makes sure that you can make the most accurate low current measurements with little to no downtime.
Highlights
- Add an SMU without sending the instrument back to the factory
- Make femptoamp measurements
- Up to 9 SMU channels
- Optimized for long cables or large chucks
Integrated solution with analytical probers and cryogenic controllers
The 4200A-SCS Parameter Analyzer supports many manual and semi-automated wafer probers and cryogenic temperature controllers, including MPI, Cascade MicroTech, Lucas Labs/Signatone, MicroManipulator, Wentworth Laboratories, LakeShore Model 336 cryogenic temperature controller.
Highlights
- "Point and click" test sequencing
- "Manual" prober mode tests prober functionality
- Fake prober mode enables debugging without removing commands
Cut Costs and Protect Your Investment
Keithley Care plans provide fast, high-quality services at a fraction of the cost of on-demand service events. You are one click or phone call away from obtaining repair coverage - no quotes, purchase orders, or approval delays.
Biosensor Characterization
Biosensors or bioFETs convert biological response to an analyte into an electrical signal. The Clarius Software that is integrated into the 4200A-SCS includes a project for testing bioFETs. Use it as a starting point to characterize transfer and output characteristics of your biosensors, and expand your work.
Femtofarad Capacitance Measurements
Measure sub-femtofarad capacitances with the 4215-CVU module. By driving 1 V AC, the 4215-CVU can achieve a noise level as low as six attofarads when measuring a 1 fF capacitor. This is just one of dozens of applications included with the Clarius software for measuring capacitance and extracting important parameters.
Highlights
- Built-in femtofarad measurement capability
- 10,000 frequency steps starting at 1kHz to 10MHz
- Customize any test to any device using user libraries
Semiconductor and NVM Reliability
Put your new technologies to the test with thorough pulsed I-V characterization. The 4200A-SCS comes with support and ready-to-run tests for the latest in NVRAM technologies, floating gate flash to ReRAM and FeRAM. Dual sourcing and measuring capabilities in current and voltage allow both transient and I-V domain characterization.
C-V Measurement for High Impedance Applications
Use Keithley’s custom Very Low Frequency C-V Technique to analyze the capacitance of your high resistance sample. This technique is performed using only source measure unit (SMU) instruments but can be combined with a 4210-CVU to perform higher frequency measurements as well.
Highlights
- .01 to 10 Hz frequency range with sensitivity of 1 pF to 10 nF
- 3½-digit typical resolution, minimum typical of 10 fF
Testing when using Long Cables or Capacitive Fixtures
Use 4201 or 4211-SMUs when making tests requires very long cabling or fixtures with higher capacitances. These SMUs are ideal for connecting to LCD test stations, probers, switch matrices or any other large or complicated tester. Field installable versions allow you to add capacity without returning the unit to a service center.
Resistivity of Materials
Use a 4200A-SCS with integrated SMUs to easily measure resistivity using a four-point collinear probe or van der Pauw method. Included tests perform repetitive van der Pauw calculations automatically, saving you valuable research time. A maximum current resolution of 10aA and input impedance of >1016 ohms give you more accurate and precise results.
MOSFET Characterization
The 4200A-SCS can hold all the instruments necessary for full characterization of MOS devices through component or on-wafer testing. Included tests and projects solve for oxide thickness of a MOSCap, threshold voltages, doping concentration, mobile ion concentration, and more. All these tests can be run at the touch of a button with a single instrument box.
| Model | Description |
|---|---|
| 4200A-SCS | PARAMETER ANALYZER MAINFRAME |
| 4200A-SCS-ND | PARAMETER ANALYZER MAINFRAME WITH NO DISPLAY |
| 4200A-SCS-PKA | 4200A-SCS BUNDLE WITH (2) 4201-SMU, (1) 4200-PA, (1) 8101-PIV |
| 4200A-SCS-PKB | 4200A-SCS BUNDLE WITH (2) 4201-SMU, (1) 4200-PA, (1) 4215-CVU, (1) 8101-PIV |
| 4200A-SCS-PKC | 4200A-SCS BUNDLE WITH (2) 4201-SMU, (2) 4211-SMU, (2) 4200-PA, (1) 4215-CVU, (1) 8101-PIV |
4200A-SCS Instruments and Modules
| Model | Description |
|---|---|
| 4200-PA | REMOTE PREAMPLIFIER MODULE |
| 4200-SMU | MEDIUM POWER SOURCE-MEASURE UNIT |
| 4200A-CVIV | I-V/C-V MULTI-SWITCH MODULE |
| 4201-SMU | MEDIUM POWER SOURCE-MEASURE UNIT |
| 4210-SMU | HIGH POWER SOURCE-MEASURE UNIT |
| 4211-SMU | HIGH POWER SOURCE-MEASURE UNIT |
| 4210-CVU | CAPACITANCE-VOLTAGE UNIT |
| 4215-CVU | HI RES CAPACITANCE-VOLTAGE UNIT |
| 4220-PGU | HIGH VOLTAGE PULSE GENERATOR UNIT |
| 4225-PMU | ULTRA-FAST PULSE MEASURE UNIT |
| 4225-RPM | REMOTE PREAMPLIFIER/SWITCH MODULE |
SKU
Keithley 4200A-SCS Parameter Analyzer
Manufacturer
Keithley
Model
Keithley 4200A-SCS Parameter Analyzer
Maximum Current
2.6 A using dual triaxial connection; 9.5 A using 5-way binding posts
Display
Mainframe Display 15.6 in. LCD, capacitive touchscreen 1920 × 1080 full HD 10 point touch. External Display External VGA, HDMI, or Display Port: The system is designed to work with an external monitor of resolution 1920 × 1080
Other Specifications/Notes
Other specifications vary depending on the installed modules. Please refer to the datasheet for more information.
Add extended service and calibration
Optimize the lifetime value of your purchase and lower your total cost of ownership with a calibration and extended warranty plan for your instrument.
Plans range from standard warranty extensions covering parts, labor, and 2-day shipping to Total Product Protection with repair or replacement coverage from wear and tear, accidental damage, ESD or EOS. See the table below for specific service options available.
Extended service and calibration options
| Service Option | Description | |
|---|---|---|
| Warranty Extension | ||
| R3 | Standard warranty extended to 3 years. Covers parts, labor and 2-day shipping within country. Guarantees faster repair time than without coverage. All repairs include calibration and updates. Hassle free - a single call starts the process. | Contact Testforce Sales Office. |
| R5 | Standard warranty extended to 5 years. Covers parts, labor and 2-day shipping within country. Guarantees faster repair time than without coverage. All repairs include calibration andupdates. Hassle free - a single call starts the process. | |
| Protections Plans | ||
| T3 | Three-year Total Protection Plan, includes repair or replacement coverage from wear and tear, accidental damage, ESD or EOS. | Contact Testforce Sales Office. |
| T5 | Five year Total Protection Plan, includes repair or replacement coverage from wear and tear,accidental damage, ESD or EOS. | |
| Calibration Coverage | ||
| C3 | Option C3: Calibration service 3 years.Includes traceable calibration or functional verification where applicable, for recommended calibrations. Coverage includes the initial calibration plus 2 years calibration coverage. | Contact Testforce Sales Office. |
| C5 | Option C5: Calibration service 5 years.Includes traceable calibration or functional verification where applicable, for recommended calibrations. Coverage includes the initial calibration plus 4 years calibration coverage. | |
| Data Reports | ||
| D1 | Calibration Data Report | Contact Testforce Sales Office. |
| D3 | Calibration Data Report 3 Years (with Option C3) | |
| D5 | Calibration Data Report 5 Years (with Option C5) | |
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