Data Acquisition – DAQ

Performs characterization and production test of semiconductor devices with timing sets and per channel pin parametric measurement unit (PPMU).

Performs voltage, current, resistance, temperature, inductance, capacitance, and frequency/period measurements, as well as diode tests, in PXI systems.

Provides digital input and output capabilities for PXI systems.

Provides analog output signals for PXI systems.

Provides analog input signals for PXI systems. Bus: PXI, PXI Express

Controls PXI and PXI Express systems from your PC or laptop computer through a software transparent link.

Provides a high-performance, compact embedded computer solution for PXI, CompactPCI, and PXI Express systems.

Houses PXI modules and connects them with a high-performance backplane that offers timing and synchronization capabilities.

Benchtop PXI Chassis Bundle with Multifunction DAQ

Benchtop PXI Chassis Bundle with SMU

USB Sound and Vibration Measurement Bundle

USB Temperature Measurement Bundle

Multifunction I/O Device

Multifunction I/O Device

 32 AI (16-Bit, 2 MS/s), 4 AO (2.86 MS/s), 48 DIO USB Multifunction I/O Device