Tektronix Webinar Got Jitter Diagnosing Power Integrity and Signal Integrity Problems?

FREE WEBINAR

Tektronix Webinar Got Jitter Diagnosing Power Integrity and Signal Integrity Problems?

Are the bit errors in your data caused by the power supply or sources inside the digital channel? Let's end the dispute by examining the connection between jitter and power integrity. We'll highlight sources of noise likely to cause jitter on serial data lines and look at other power analysis methods from 3-phase inverter analysis to isolated probing.

By the end of this webinar will learn how to:

  • Detect ripple and its effects on a high-speed serial clock using power rail analysis software
  • Mitigate signal integrity problems cause by the PDN (power distribution network)
  • See additional capabilities of modern oscilloscopes make complex power measurements easier and more repeatable

Watch the on demand webinar today!

About the Presenter

Cameron Lowe
Field Applications Engineer, Tektronix

Cameron Lowe is a field applications engineer for Tektronix supporting the time and frequency domain product portfolio in the Midwestern region of the U.S. He has a bachelor’s degree in Electrical Engineering from the University of Dayton.


Speak with a Live Agent

Would you like to speak with a Technical Advisor to help pick the right instrument for your specific needs?

Click the Chat Now button in the bottom right corner to speak with a Testforce Systems USASupport Agent and even set up a 1-on-1 session with a Pro near you!


More from Testforce Academy